Q-Control - Controlling the force interaction in AFM
In scanning force microscopy often dynamic modes are used, in which in
contrast to static modes the micromechanical probe is interacting with
the sample surface just temporary. Thereby in principle it is possible
to reduce the forces exerted by the probing tip on the sample. The
Q-Control module is a modification or hardware add-on to scanning force
microscopes that comprises an additional feedback circuit. It allows to
increase the effective quality factor of the dynamic system. As a
results a further significant reduction of the interaction forces
between the probe and the sample can be achieved.

Various applications show that many highly sensitive surface
structures, in particular ultrathin organic layers or biological
samples in liquids, can only be non-destructively imaged and
characterized by using such an active feedback circuit. Furthermore,
Q-Control often allows to improve the maximum achievable resolution in
topographical measurements and to increase the overall sensitivity for
magnetic or electrostatic fields.
How It Works
When operating a scanning force microscope in a dynamic mode the
oscillation of the cantilever is influenced by non-linear interaction
forces between the probing tip and the surface. In principle the
instantaneous forces exerted on the sample while scanning the surface
can be either repulsive or attractive. Experimental findings and
corresponding computer simulations of the tapping mode show that by
choosing appropriate system parameters the scanning force microscope
can continuously be operated in the regime of net-attractive
interaction forces. Thereby the risk of modifying the sample surface by
the probing tip is minimized. However, in most cases the range in which
the system parameters have to be adjusted is rather narrow and
therefore a stable operation of the scanning force microscope in this
interaction regime is difficult to achieve.
With the help of the Q-Control module it is possible to reduce the
damping of the dynamic system, i.e. to increase the effective quality
factor of the oscillating cantilever and thereby to enlarge the regime
of net-attractive interaction forces. This method allows the user to
minimize the forces exerted by the probing tip on the sample surface.
Therefore by applying Q-Control delicate and highly sensitive surface
structures that could not be scanned with a standard scanning force
microscope can now be characterized with high resolution.
Typical resonance curve of a free oscillating silicon cantilever in air.
By applying Q-Control the effective quality factor was increased from about 450 to almost 20000.
The high quality factor implicates a steep slope of the phase signal.
In a liquid medium the oscillation of a cantilever is strongly
affected by hydrodynamic damping. This leads to quality factors in the
single digit range and a loss in force sensitivity. The Q-Control
technique as a countermeasure allows increasing the effective quality
factor up to three orders of magnitude in liquids.
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